Nanoscale Characterization of Surfaces and Interfaces (N. DiNardo John) ; John Wiley & Sons Limited
12153 р.
Автор(ы): N. DiNardo John;
Издатель: John Wiley & Sons Limited
ISBN: 9783527615940
ID: SKU704313
Добавлено: 23.08.2021
Цены
Цена от 12153 р. до 12153 р. в 1 магазинах
Магазин | Цена | Наличие |
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ЛитРес 5/5 | 12153 р. 15191 р. электронная книга | скачать фрагмент | |
Лабиринт 5/5 | ||
Читай-город 5/5 | ||
МАЙШОП 5/5 | Один из первых книжных интернет-магазинов, работающий с 2002 года | |
Описание
Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Topics include: Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information
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О книге
Автор(ы) | N. DiNardo John |
Издатель | John Wiley & Sons Limited |
Форматы электронной версии | |
ISBN | 978-3-527-61594-0 |
Технические науки - издательство "John Wiley & Sons Limited"
Категория 9722 р. - 14583 р.
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